USB Flash Longevity Testing – Year 2

Year 0 – I filled 10 32-GB Kingston flash drives with random data.
Year 1 – Tested drive 1, zero bit rot. Re-wrote the drive with the same data.
Year 2 – Re-tested drive 1, zero bit rot. Tested drive 2, zero bit rot. Re-wrote both with the same data.

They have been stored in a box on my shelf, with a 1-month period in a moving van (probably below freezing) this year.

Will report back in 1 more year when I test the third 🙂

FAQs:

  • Q: Why didn’t you test more kinds of drives?
    A: Because I don’t have unlimited energy, time and money :). I encourage you to!
  • Q: You know you powered the drive by reading it, right?
    A: Yes, that’s why I wrote 10 drives to begin with. We want to see how something works if left unpowered for 1 year, 2 years, etc.
  • Q: What drive model is this?
    A: The drive tested was “Kingston Digital DataTraveler SE9 32GB USB 2.0 Flash Drive (DTSE9H/32GBZ)” from Amazon, model DTSE9H/32GBZ, barcode 740617206432, WO# 8463411X001, ID 2364, bl 1933, serial id 206432TWUS008463411X001005. It was not used for anything previously–I bought it just for this test.
  • Q: Which flash type is this model?
    A: We don’t know. If you do know, please tell me.
  • Q: What data are you testing with?
    A: (Repeatable) randomly generated bits
  • Q: What filesystem are you using? / Doesn’t the filesystem do error correction?
    A: I’m writing data directly to the drive using Linux’s block devices.

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